SYARIF, A. Y.; DEMIR, E.; KAYA, M. Interpretable Deep Learning for Industrial Fault Detection. International Journal of Smart Systems, [S. l.], v. 1, n. 2, p. 83–95, 2023. DOI: 10.63876/ijss.v1i2.74. Disponível em: https://ijss.etunas.com/index.php/ijss/article/view/74. Acesso em: 4 feb. 2026.